Comparison of LFSR and CA for BIST
نویسنده
چکیده
Built-In Self-Test (BIST), as the name suggests is a technique in which the circuit is capable of testing itself. This paper presents two techniques: Linear Feedback Shift Register (LFSR) and Cellular Automata (CA), used for test pattern generation and test response analysis in a typical BIST circuit. Both LFSR and CA are analyzed based on their construction and characteristics. A comparison of LFSR and CA is presented to demonstrate their shortfalls and suitability to certain applications.
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